The Exponentiated Weibull Software reliability growth model with various testing-efforts and optimal release policy: a performance analysis

Ahmad, Nesar and Bokhari, M.U. and Quadri, S.M.K. and Khan, Mohammad G.M. (2008) The Exponentiated Weibull Software reliability growth model with various testing-efforts and optimal release policy: a performance analysis. International Journal of Quality and Reliability Management, 25 (2). pp. 211-235. ISSN 0265-671X

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Abstract

Purpose – The purpose of this research is to incorporate the exponentiated Weibull testing-effort functions into software reliability modeling and to estimate the optimal software release time. Design/methodology/approach – This paper suggests a software reliability growth model based on the non-homogeneous Poisson process (NHPP) which incorporates the exponentiated Weibull (EW) testing-efforts. Findings – Experimental results on actual data from three software projects are compared with other existing models which reveal that the proposed software reliability growth model with EW testing-effort is wider and effective SRGM. Research limitations/implications – This paper presents a SRGM using a constant error detection rate per unit testing-effort. Practical implications – Software reliability growth model is one of the fundamental techniques to assess software reliability quantitatively. The results obtained in this paper will be useful during the software testing process. Originality/value – The present scheme has a flexible structure and may cover many of the earlier results on software reliability growth modeling. In general, this paper also provides a framework in which many software reliability growth models can be described.

Item Type:	Journal Article
Subjects:	Q Science > Q Science (General)
Divisions:	Faculty of Science, Technology and Environment (FSTE) > School of Computing, Information and Mathematical Sciences
Depositing User:	Ms Neha Harakh
Date Deposited:	08 Feb 2008 23:55
Last Modified:	15 Mar 2017 22:08
URI:	http://repository.usp.ac.fj/id/eprint/154

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